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กล้องจุลทรรศน์เกี่ยวกับการวัด

รหัสสินค้า:120728
สั่งซื้อขั้นต่ำ: ไม่ระบุ
ข้อมูลสินค้า:
  1. LCD/CF Micro – structures
  2. High Density Connected PCB


กดดูเบอร์โทรผู้ขาย 0-2738-7300

ผู้เข้าชม 996 ครั้ง

ข้อมูลสินค้าและเนื้อหาอื่น ๆ ในนี้ถือ เป็นลิขสิทธิ์ของผู้ขาย B2BThai.com เป็นสื่อกลางในการนำเสนอเนื้อหาเท่านั้น

รายละเอียดสินค้า : กล้องจุลทรรศน์เกี่ยวกับการวัด

คำค้น :
Application :

The SUPRA Optix is the latest development in the field of Scanning White-light Interferometry.  With the features of compact, flexible design, high speed, user-friendly, 3D measurement and up to 400 um vertical scanning range with nanometer resolution, the SUPRA Optix supports new applications in quantitative surface analysis :

- Wafer
- DVD Disk
- MEMS Structures
- LCD/CF Micro – structures
- High Density Connected PCB
- IC Package
and many other applications in materials and surface research.
 

Inspection Examples :

 
Step-Height Standards
(Depth: 28nm)
Fresnel Diffractive Micro-lens
(Height: 452nm)
Optical Wave-guide
(Height: 38 um)
Laser Drilling on PCB
(Depth: 30 um)
LCD Back-light Plate
(Height: 12 um)
Overlay Mark on Wafer
(Height: 1 um)
Optical Fiber in Ceramic Ferrule RGB Layer on LCD Color Filter IC Chip Bumper
 
High – Speed Scanning and Processing Software (ImgScan) :
ImgScan integrated with scanning hardware interpret the interference fringes.
Innovative patented analysis software with vertical resolution up to 0.1 nm.
High – speed scanning design and algorism.
Easily selecting vertical scanning range.
Optional 10X, 20X and 50X interferometric objective lense.
Easy sample positioning by on-screen digital XYZ coordinates display.
Manual/Automatic light intensity adjustment for optimal interfering fringe contrast.
High precision PVSI mode and high speed VXI mode are selectable.
Patented algorithm are developed to analyze half-transparent sample.
Automatic patching.
User selectable scanning directions.
 
Professional 3D Graphic analysis Software (PostTopo) :
Powerful and user-friendly 3D graphic analysis software.
Automatic surface leveling.
Self-calibration function by step-height standards.
Supporting depth/height analysis by line or local area.
Line analysis results on surface roughness, waviness and step height are traced to ISO definition. The 17 ISO-defined parameters and 4 extra parameters are supported.
Local area analysis supports graphic, statistics, and 2D-FFT analysis tool boxes. The 2D FFT analysis includes smoothing, sharpening and many kinds of digital filtering.
Measurement results can be files with different graphic formats or Excel files.
 

Specification :

 
Model AT-511
   Configuration    Microscope, Scanning controller, Stage, Imaging unit, Computer
   Microscope Body    Mono microscope (standard)
   Interference Objectives    (Optional) Magnification FOV (mm) Optical resolution (um)
10X 1 1.12
20X 0.5 0.84
50X 0.2 0.61
   Vertical Scanning Controller    Scanning range    100 um (400 um, optional)
   Scanning resolution    0.1 nm
   Scanning mode    Automatic
   Light intensity Adjustment    Automatic/ Manual
   Sample Stage    X-Y stage    150 mm x 100 mm, manual (standard)    with linear scale (1 um)
   X-Y position counter    Linear scale exchanger with USB    interface
   Z stage    80 mm. Manual (standard)
   Tit Stage    Manual
   Imaging Unit    Image sensor    Area CCD (standard)
   Sensor resolution    640 x 480 pixels (standard)
   Computer    Pentium-computer, 17" LCD Monitor, 200 GB Hard disk driver
   Analysis Software    MS-Windows compatible data acquisition and analysis software,    including : ISO roughness/step-height analysis, FFT and filtering,    various 2D and 3D views, profile analysis, zooming, conversation to    standard image formats, etc.
   Step-Height Standards    (Optional)    50 nm, 150 nm, 450 nm, 1800nm

ส่งข้อความติดต่อ

ถึง :

บริษัท อัลฟาเทค กรุ๊ป 2004 (ประเทศไทย) จำกัด

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